The suitable tool for surface roughness measurement will depend on the scale and properties of the material. The following tools are available in the lab:

• sub-nanometer – few hundred nm height surface features:   For both transparent and opaque materials, the Bruker Icon AFM is suitable for measuring areas less than 100 μm x 100 μm.
  

  AFM

• sub-nanometer – micron height surface features:   For opaque materials, the Olympus LEXT OLS5000 Laser Confocal Microscope are suitable from hundreds of micron FOV to a few millimeters