AFM provides surface topology by using a probe to detect the intermolecular forces between the sample surface and the probe.
Analytical Modes
- Contact Mode
- Tapping Mode
- Bruker ScanAyst Mode and Peak Force Tapping Mode
- Magnetic Force Microscopy
- Fluid Cell Imaging
- Special Deep trench probe for high aspect ration imaging
- Contact Resonance Piezo Response Microscopy (DCube-CR-PFM mode)
- Conductive AFM (C-AFM)
- PeakForce KPFM
Uses and Applications
- Measurement of nanoscale surface roughness from <1 nm to ~500 nm
- Measurement of nanoscale step height
- Analysis in fluid cells and in controlled environments
- Atomic-scale surface manipulation and modification
- Quantitative measurement of surface roughness
- Elastic modulus ranges from ~1 MPa to 50 Gpa
- Adhesion forces ranges from ~10 pN to 10 N
- New DataCube contact resonance piezo response microscopy provides piezo-electrical
properties and nanomechanical spectra at every point based on FastForce Volume - Imaging variations in conductivity and quality/integrity of conductive samples by
measuring current, including variations in film thickness, location of electrical defects, and
other characteristics - correlated quantitative
nanomechanical information with PeakForce QNM
HOURLY RATES | ||
Users | Daytime | Overnight M-F: 5pm - 8am Sat-Sun: All Day |
On-Campus members | $35.00 | $17.50 |
Off-Campus Academic | $53.90 | $26.95 |
Industry | $70.00 | $35.00 |
CONTACT US FOR RESERVATIONS: | |
Dr. Randy Polson | Lab: 801-587-3108 Office: 801-587-0873 |
Dr. Bobby Duersch | Lab: 801-587-3108 Office: 801-587-0684 |
Dr. Brian Van Devener | Lab: 801-587-3108 Office: 801-585-6162 |
Selected Publications
Tian, K., Tudu, B., Tiwari, A.,
Growth and Characterization of Zinc Oxide Thin Films on Flexible Substrates at Low Temperature Using Pulsed Laser Deposition,
Vacuum, 2017, 146, 483 - 491.
Siegel, G.P., Prestgard, M.C., Yang, H.Y., and Tiwari, A.
Spin Current Response in Bi-YIG/Pt Thin Film Heterostructures Induced by Gamma Radiation,
IEEE Electr. Device L., 2015, 36, 853 – 855
Spin Current Response in Bi-YIG/Pt Thin Film Heterostructures Induced by Gamma Radiation,
IEEE Electr. Device L., 2015, 36, 853 – 855
Wang, P., and Menon, R.
Ultra-High-Sensitivity Color Imaging via a Transparent Diffractive-Filter Array and Computational Optics,
Optica, 2015, 2, 933 – 939.
Ultra-High-Sensitivity Color Imaging via a Transparent Diffractive-Filter Array and Computational Optics,
Optica, 2015, 2, 933 – 939.
Chen, D., and Minteer, S.D.
Mechanistic Study of Nickel Based Catalysts for Oxygen Evolution and Methanol Oxidation in Alkaline Medium,
J. Power Sources, 2015, 284, 27 – 37.
Mechanistic Study of Nickel Based Catalysts for Oxygen Evolution and Methanol Oxidation in Alkaline Medium,
J. Power Sources, 2015, 284, 27 – 37.
Erkan, M.E., Chawla, V., Repins, I., and Scarpulla, M.A.
Interplay Between Surface Preparation and Device Performance in CZTSSe Solar Cells: Effects of KCN and NH4OH Etching,
Sol. Energ. Mat. Sol. C., 2015, 136, 78.
Interplay Between Surface Preparation and Device Performance in CZTSSe Solar Cells: Effects of KCN and NH4OH Etching,
Sol. Energ. Mat. Sol. C., 2015, 136, 78.
To see more of our publications click here.