Crystal Structure and Grain Analysis

  • Crystallites and precipitates from 0.5 nm to <1 μm:

Convergent beam diffraction (CBD), nanobeam diffraction (NBD) and selected area electron diffraction using the JEOL JEM2800 S/TEM. Samples need to be <50 nm thin

SAD, CBD and NBD in S/TEM

                                                    SAD, CBD and NBD in S/TEM

  • Grain size >50 nm:

Electron backscatter diffraction (EBSD) using either the Helios Nanolab 650 or the Quanta 650F Samples need to be flat and polished to ~0.05 micron roughness. 3D grain imaging is also available on the Helios Nanolab 65 through a combination of ion beam polishing and EBSD

EBSD

                        EBSD                                                        RD