The JSM-IT200 is an easy-to-use SEM focused on cost performance of high functionalities for significantly higher throughput. Specimen Exchange Navi, a beginner-friendly function, offers guided operation from sample loading to area search, and SEM image observation. “Zeromag” for seamless transition from optical to SEM imaging, “Live Analysis” for real time display of elemental analysis results, SMILE VIEW(TM) Lab for seamless report generation of observation and/or analysis results, etc., provide fast analysis with integrated transition from OM to SEM. Fast observation, analysis and report generation.
Uses and Applications
- High resolution secondary and backscatter electron imaging up to 30kV beam energy for conductive materials
- Low vacuum mode for non-conductive materials
- Low voltage imaging up to 2kV for a more detailed image of the surface
- High resolution imaging of large areas (up to 4mm) using montage function
Specific Capabilities
- Capable of high resolution imaging and analysis at WD 10 mm
- Multi-touch control capability provides intuitive, operation of the microscope
- Operation navigator facilitates the entire process of operation from condition setting to imaging and analysis
- Zeromag function links the SEM image with the Holder Graphic or SNS imag. This facilitates navigation with seamless transitioning from the optical to SEM image
- Built in montage function
- Movie capture of live image (AVI format)
- Low vacuum mode and backscattered electron detector are standard, allowing observation
of non-conductive samples without lengthy sample preparation - Charge free scan (CF scan) system minimizes charge accumulation on nonconductive
samples
HOURLY RATES | ||
Users | Daytime | Overnight M-F: 5pm - 8am Sat-Sun: All Day |
On-Campus members | $30.00 | $15.00 |
Off-Campus Academic | $46.20 | $23.10 |
Industry | $60.00 | $30.00 |
CONTACT US FOR RESERVATIONS: | |
Dr. Randy Polson | Lab: 801-587-3108 Office: 801-587-0873 |