JEOL JSM IT200 Scanning Electron Microscope | Electron Microscopy and Surface Analysis Lab

The JSM-IT200 is an easy-to-use SEM focused on cost performance of high functionalities for significantly higher throughput. Specimen Exchange Navi, a beginner-friendly function, offers guided operation from sample loading to area search, and SEM image observation. “Zeromag” for seamless transition from optical to SEM imaging, “Live Analysis” for real time display of elemental analysis results, SMILE VIEW（TM） Lab for seamless report generation of observation and/or analysis results, etc., provide fast analysis with integrated transition from OM to SEM. Fast observation, analysis and report generation.

Uses and Applications

High resolution secondary and backscatter electron imaging up to 30kV beam energy for conductive materials
Low vacuum mode for non-conductive materials
Low voltage imaging up to 2kV for a more detailed image of the surface
High resolution imaging of large areas (up to 4mm) using montage function

Specific Capabilities

Capable of high resolution imaging and analysis at WD 10 mm
Multi-touch control capability provides intuitive, operation of the microscope
Operation navigator facilitates the entire process of operation from condition setting to imaging and analysis
Zeromag function links the SEM image with the Holder Graphic or SNS imag. This facilitates navigation with seamless transitioning from the optical to SEM image
Built in montage function
Movie capture of live image (AVI format)
Low vacuum mode and backscattered electron detector are standard, allowing observation
of non-conductive samples without lengthy sample preparation
Charge free scan (CF scan) system minimizes charge accumulation on nonconductive
samples

HOURLY RATES
Users	Daytime	Overnight M-F: 5pm - 8am Sat-Sun: All Day
On-Campus members	$29.00	$14.50
Off-Campus Academic	$44.23	$22.13
Industry	$58.00	$29.00

CONTACT US FOR RESERVATIONS:
Dr. Randy Polson	Lab: 801-587-3108 Office: 801-587-0873