ELECTRON MICROSCOPY

 JEOL JEM 2800 SCANNING/TRANSMISSION ELECTRON MICROSCOPE (STEM) 

  • Sub nanometer high-resolution imaging for crystalline materials
  • Elemental contrast imaging using STEM bright and dark field modes
  • Nanoscale imaging of organic and biological samples in wet conditions with the use of the Protochips Poseidon wet cell
  • Nanoscale imaging of samples under varying conditions of high temperature, high pressure and different reactive gases with the use of the Protochips atmospheric cell holder
  • Nanoscale3D tomography imaging
  • Crystal structure analysis from micron to nanometer scale using wide array of diffraction techniques - selected area (SAED), nano-beam (NBD), and convergent beam (CBD) diffraction
  • Nanometer-scale and fast elemental mapping and compositional analysis using dual detector energy dispersive spectroscopy (EDS)

ENVIRONMENTAL SEM: QUANTA 600F

  • High-resolution imaging ~20 nm resolution for conductive materials
  • Imaging of large (up to 6 inch diameter) samples without sectioning
  • Elemental contrast using backscatter electron imaging
  • Imaging of non-conductive materials i.e., ceramics, polymers and biological samples, without the aid of conductive coating
  • Imaging of wet samples using environmental mode
  • Voltage contrast imaging
  • Elemental mapping and semi-quantitative compositional analysis using energy dispersive spectroscopy (EDS)
  • Automated particle morphology and elemental analysis using EDS
  • Grain analysis (grain size, orientation and texture) using electron backscatter diffraction (EBSD)

LOW-VOLTAGE SEM: FEI TENEO

  • High-resolution imaging ~20 nm resolution for conductive and non-conductive materials
  • Hight resolution imaging of non-conductive materials i.e., ceramics, polymers and biological samples at low voltages, without the aid of conductive coating
  • Imaging of large (up to 100 cm diameter) samples without sectioning
  • Elemental contrast using backscatter electron imaging
  • Elemental mapping and semi-quantitative compositional analysis using energy dispersive spectroscopy (EDS)
  • Grain analysis (grain size, orientation and texture) using electron backscatter diffraction (EBSD)

DUAL BEAM SEM/FIB: HELIOS NANOLAB 650

  • High-resolution imaging <10 nm resolution for conductive materials
  • Elemental contrast using backscatter electron imaging
  • Low-voltage, low-current imaging of non-conductive samples
  • Elemental mapping and semi-quantitative compositional analysis using energy dispersive spectroscopy (EDS)
  • Automated particle morphology and elemental analysis using EDS
  • Voltage contrast imaging
  • Grain analysis (grain size, orientation and texture) using electron backscatter diffraction (EBSD)
  • Automated particle morphology and elemental analysis using EDS
  • Sectioning of thin specimen using ion beam

JEOL JSM IT200 SEM

  • High resolution secondary and backscatter electron imaging up to 30kV beam energy for conductive materials
  • Low vacuum mode for non-conductive materials
  • Low voltage imaging up to 2kV for a more detailed image of the surface
  • High resolution imaging of large areas (up to 4mm) using montage function
  • Zeromag function links the SEM image with the Holder Graphic or SNS image. This facilitates navigation with seamless transitioning from the optical to SEM image