X-ray Analysis: Chemical Composition and Structure

Bruker D8 Discover XRD

BRUKER DISCOVER D8 HIGH RESOLUTION XRD WITH HEATED STAGE

  • Phase identification and quantification, structure determination and refinement, micro-strain and crystallite size analysis.
  • X-Ray reflectometry, Grazing Incidence Diffraction (GID), In-Plane Diffraction, High-resolution XRD, GISAXS, GI-Stress analysis, crystal orientation analysis.
  • Residual stress analysis, texture and pole figures.
  • Total scattering analysis: Bragg Diffraction, Pair-Distribution Function (PDF)

X-RAY, AUGER, ULTRAVIOLET PHOTOELECTRON SPECTROSCOPY (XPS),(AES),(UPS): KRATOS AXIS ULTRA

  • Quantitative chemical analysis of the top 10 nm surface layer
  • Identification of bonding and oxidation state of elements on the surface
  • Overlayer thickness measurement up to ~10 nm
  • Depth profiling of up to ~100 nm using Ar+ ion sputtering
  • Fermi-level and work function measurement via ultraviolet photoelectron spectroscopy (UPS) with He(I) and He(II) sources
  • Scanning electron and scanning auger microscopy ~15 μm resolution
  • Chemical analysis of the top monolayer using ion scattering spectroscopy (ISS) with He ion source

SAXSPOINT 5.0 SAXS/WAXS/GISAXS/RHEOSAXS LABORATORY BEAMLINE

  • determining size and shape of monodisperse macromolecules
  • measuring pore size
  • nanoparticle size distribution
  • distances of partially ordered materials
  • general characterization of micro- to nanoscale structure of particle systems (i.e. average particle size, shapes, distribution, and surface-to-volume ratio
  • samples can be solid, liquid or a mixture of both

ZEISS XRADIA VERSA 620 3D X-RAY MICROSCOPE/NANO-CT

  • Crystallographic imaging modalities enabled by lab DCT
  • Characterize material evolution over time (heat, cool, mechanical load)
  • In-situ heating/cooling/tension/compression stage. Up to 5kN loads to materials.
  • Large volume sample imaging enabled by Flat Panel Extension
  • Tomographic Reconstruction software
  • 3D visualization and segmentation software (Dragonfly Pro)

 NANOSCALE EDS JEOL JEM 2800 S/TEM 

  • Sub nanometer high-resolution imaging for crystalline materials
  • Elemental contrast imaging using STEM bright and dark field modes
  • Nanoscale imaging of organic and biological samples in wet conditions with the use of the Protochips Poseidon wet cell
  • Nanoscale imaging of samples under varying conditions of high temperature, high pressure and different reactive gases with the use of the Protochips atmospheric cell holder
  • Nanoscale3D tomography imaging
  • Crystal structure analysis from micron to nanometer scale using wide array of diffraction techniques - selected area (SAED), nano-beam (NBD), and convergent beam (CBD) diffraction
  • Nanometer-scale and fast elemental mapping and compositional analysis using dual detector energy dispersive spectroscopy (EDS)

MICRON-SCALE EDS QUANTA 600F ENVIRONMENTAL SEM

  • High-resolution imaging ~20 nm resolution for conductive materials
  • Imaging of large (up to 6 inch diameter) samples without sectioning
  • Elemental contrast using backscatter electron imaging
  • Imaging of non-conductive materials i.e., ceramics, polymers and biological samples, without the aid of conductive coating
  • Imaging of wet samples using environmental mode
  • Voltage contrast imaging
  • Elemental mapping and semi-quantitative compositional analysis using energy dispersive spectroscopy (EDS)
  • Automated particle morphology and elemental analysis using EDS
  • Grain analysis (grain size, orientation and texture) using electron backscatter diffraction (EBSD)

MICRON-SCALE EDS FEI TENEO LOW-VOLTAGE SEM

  • High-resolution imaging ~20 nm resolution for conductive and non-conductive materials
  • Hight resolution imaging of non-conductive materials i.e., ceramics, polymers and biological samples at low voltages, without the aid of conductive coating
  • Imaging of large (up to 100 cm diameter) samples without sectioning
  • Elemental contrast using backscatter electron imaging
  • Elemental mapping and semi-quantitative compositional analysis using energy dispersive spectroscopy (EDS)
  • Grain analysis (grain size, orientation and texture) using electron backscatter diffraction (EBSD)

MICRON-SCALE EDS HELIOS NANOLAB 650 DUAL BEAM SEM/FIB

  • High-resolution imaging <10 nm resolution for conductive materials
  • Elemental contrast using backscatter electron imaging
  • Low-voltage, low-current imaging of non-conductive samples
  • Elemental mapping and semi-quantitative compositional analysis using energy dispersive spectroscopy (EDS)
  • Automated particle morphology and elemental analysis using EDS
  • Voltage contrast imaging
  • Grain analysis (grain size, orientation and texture) using electron backscatter diffraction (EBSD)
  • Automated particle morphology and elemental analysis using EDS
  • Sectioning of thin specimen using ion beam

MICRON-MILLIMETER SCALE EDS EAGLE III MICROSPOT X-RAY FLUORESCENCE SPECTROMETER (XRF)

  • Capable of detecting elements rom Na to U
  • 0.1 mm spatial resolution
  • Automated stage movement for elemental mapping
  • Up to 10 cm x 10 cm area of sample mapping