Equipment List

Scanning Electron Microscopes (SEM)

JEOL JEM 2800 STEM

Scanning Transmission Electron Microscope (STEM)

X-ray Diffractometer (XRD)

  • Bruker D8 Discover high resolution XRD
    • Heating stage up to 1100° C
    • Cooling Stage up to -180° C

Atomic Force Microscope (AFM)

  • Bruker Dimension Icon with Scan Assist(TM)
    • Magnetic Force AFM
    • Fluid Cell Imaging
    • CR-PFM mode
    • Conductive AFM
    • Peak Force KPFM

Nanoindenter/Picoindenter

Optical Microscopes

Coaters

Magnetometer

Mechanical Prep Tools

Ion Milling Tools

Focused Ion Beam SEM (FIB-SEM)

X-ray Photoelectron Spectrometer (XPS)

SAXS/WAXS/GISAXS/RheoSAXS

X-ray Microscope/Nano-CT

Micromechanical Test Stages

Laser Confocal Microscope

X-ray Fluorescence Spectrometer (XRF)

Ellipsometer

Triple Quad LC/MS

Laser Marker

  • EzLaze 3 Laser Cutting System