Equipment List

Scanning Electron Microscopes (SEM) FEI Quanta 600F with BSE, EDS, ESEM, EBSD FEI TENEO with EDS and EBSD FEI Helios Nanolab 650 dual beam SEM/FIB JEOL JSM IT200 SEM

Scanning Transmission Electron Microscope (STEM) JEOL JEM 2800 with twin SDD EDS detectors

X-ray Diffractometer (XRD) Bruker D8 Discover high resolution XRD with heated stage

Atomic Force Microscope (AFM) Bruker Dimension Icon with Scan Assist(TM)

Nanoindenter/Picoindenter Hysitron TI Premier Hysitron PI89 SEM Picoindenter

Optical Microscopes Keyence VHX 5000 Olympus LEXT OLS5000 Reichart Polyvar MET Vertex Micro Vu

Coaters Leica EM ACE600 Gatan PECS 1 Gatan PECS 2

Magnetometer Microsense EZ7 VSM

Polishing Tools Allied Mechanical Polishers Fischione Ion Mill

Focused Ion Beam SEM (FIB-SEM) FEI Helios Nanolab 650 dual beam SEM and FIB with BSE, EDS, EBSD

X-ray Photoelectron Spectrometer (XPS) Kratos Axis Ultra DLD with UPS, ISS, Auger analysis mode

SAXS/WAXS/GISAXS/RheoSAXS Anton Paar SAXSPoint 5.0

X-ray Microscope/Nano-CT Zeiss Xradia Versa 620

Tensile/Compression Stages Deben CT5000 5kN Anton Parr SAXS Tensile Stage

Laser Confocal Microscope Olympus LEXT OLS5000

X-ray Fluorescence Spectrometer (XRF) EDAX Microspot Eagle III

Ellipsometer Woollam Variable Angle Spectroscopic Ellipsometer

Triple Quad LC/MS Agilent 6470B Triple Quad LC/MS